DFT
At Loom Semiconductor and information Technology, we deliver comprehensive Design for Testability (DFT) solutions that ensure high-quality silicon and faster time-to-market for semiconductor products. Our expertise spans from architecture to silicon bring-up, helping clients achieve optimal test coverage, reduced test costs, and improved product reliability.
Our DFT Capabilities
Scan Insertion & Compression
Efficient scan architecture implementation with advanced compression techniques to reduce pattern volume and test time.
Boundary Scan (JTAG/IEEE 1149.x)
Industry-standard boundary scan insertion for effective board-level testing and diagnostics.
MBIST (Memory Built-In Self-Test)
Design and integration of MBIST controllers to validate embedded memories with high fault coverage.
LBIST (Logic Built-In Self-Test)
On-chip test solutions for safety-critical applications, supporting automotive (ISO 26262) and other compliance standards.
ATPG (Automatic Test Pattern Generation)
High-coverage ATPG implementation, pattern generation, and test validation across various fault models.
DFT Verification
Structural checks, rule-based verification, and simulation-based validation to ensure DFT readiness.
Why Choose Us?
Proven Expertise: Experience in handling complex SoC and ASIC designs across multiple technology nodes.
End-to-End Support: From planning and insertion to test program generation and silicon debug.
Domain Coverage: Automotive, AI/ML, Networking, Consumer Electronics, and High-Performance Computing.
Quality & Compliance: Alignment with industry standards such as IEEE, ISO 26262, and safety-critical requirements.
Engagement Models
Turnkey DFT Solutions – Complete ownership from DFT architecture to test sign-off.
Staff Augmentation – Skilled DFT engineers to strengthen your in-house team.
Consulting Services – Architecture review, methodology setup, and best-practices enablement.